- Versatile SWIR T2SL camera with response up to 2.5 µm
- Superior performance for reliable research
- Compact SWIR camera equipped with a T2SL detector array for imaging in the 1.0 to 2.5 µm wavelength range
- The camera features a resolution of 320 x 256 pixels with a 30 µm pixel pitch
- It outputs 14-bit data and comes in a 100 Hz or 350 Hz version
The Xeva-2.5-320 SWIR camera interfaces to PC via standard USB 2.0 and CameraLink. Each camera is delivered with Xeneth software, which offers direct access to various camera settings such as exposure time and operating temperature.
Through its advanced thermo-mechanical design, the Xeva-2.5-320 SWIR camera achieves excellent performance levels using a TE4-cooled device operating at temperatures down to 203 K.
Benefits & features
- Spectrometer compatibleThese cameras have mounting holes for spectrographs, making them suitable for (hyper)spectral imaging applications
- CameraLink and triggering for high speed imaging
- High Speed SWIR imaging up to 2.5 µm
- Smallest TE4-cooled camera
- Flexible programming in an open architecture
Designed for use in
- R&D (SWIR range)
- Semiconductor inspection
- Hyperspectral SWIR imaging
- Art inspection
- Laser beam profiling