- OEM module for SWIR gated imaging
- Extremely short 100 nsec integration time for SWIR gated imaging
- The XSW-320 Gated SWIR OEM module operates in the 0.9 to 1.7 μm spectral band and provides extremely short integration times (down to 100 ns)
- Its InGaAs detector has a resolution of 320 x 256 pixels and a pixel pitch of 20 µm
A special feature of the XSW-320 Gated is the programmable trigger-out delay between the internally generated trigger-out pulse and the start of integration. The exposure time of the sensor is configurable from 100 ns up to 1 ms in steps of 100 ns, or 1 ms to 40 ms (standard mode).
With all these features, the XSW-320 Gated is the perfect SWIR OEM module for SWIR gated imaging, the inspection of light bulbs and SWIR imaging of hot or fast moving objects.
Benefits & features
- CameraLink or Ethernet standard interfaces
- Extreme short 100 nsec integration time
- Flexible programming in an open architecture
- High sensitivity and excellent image quality
- Programmable trigger out
Designed for use in
- Laser gated imaging
- Measurement systems needing synchronisation of the camera with a pulsed laser
- Imaging of hot or moving objects such as light bulb or turbine blades inspection
- R&D (SWIR) with short integration times