XSW-320 Gated

  • OEM module for SWIR gated imaging
  • Extremely short 100 nsec integration time for SWIR gated imaging
  • The XSW-320 Gated SWIR OEM module operates in the 0.9 to 1.7 μm spectral band and provides extremely short integration times (down to 100 ns)
  • Its InGaAs detector has a resolution of 320 x 256 pixels and a pixel pitch of 20 µm

A special feature of the XSW-320 Gated is the programmable trigger-out delay between the internally generated trigger-out pulse and the start of integration. The exposure time of the sensor is configurable from 100 ns up to 1 ms in steps of 100 ns, or 1 ms to 40 ms (standard mode).

With all these features, the XSW-320 Gated is the perfect SWIR OEM module for SWIR gated imaging, the inspection of light bulbs and SWIR imaging of hot or fast moving objects.

Benefits & features

  • CameraLink or Ethernet standard interfaces
  • Extreme short 100 nsec integration time
  • Flexible programming in an open architecture
  • High sensitivity and excellent image quality
  • Programmable trigger out

Designed for use in

  • Laser gated imaging
  • Measurement systems needing synchronisation of the camera with a pulsed laser
  • Imaging of hot or moving objects such as light bulb or turbine blades inspection
  • R&D (SWIR) with short integration times